Paper accepted for IWSSPS 2008

Myoung Sub Shim, In Hwan Doh, Youngje Moon, Hyojeong Lee, Jongmoo Choi, Donghee Lee, and Sam H. Noh, The Effect of Absorbing Hot Write References on FTLs for Flash Storage Supporting High Data Integrity, In Proceedings of the 3rd International Workshop on Software Support for Portable Storage (IWSSPS’08), Atlanta, Georgia, USA, October 23, 2008.

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